STUDY OF THE RELATION BETWEEN THE RELIABILITY AND THE NOISE OF DIGITAL SILICON INTEGRATED CIRCUITS

Authors

  • Zsolt Kincses
  • Pál Bánlaki

Abstract

The conventional reliability tests give information about a quantity of the parts. Related to individual devices it means probability characteristics. In many cases - when the failure of the built-in parts can cause a great loss or injury - there is a need to screen out the parts of shorter lifetime of the lot. These ones can show the same perfect quality as the other ones at the beginning of their use. There are screening methods which are usable to find the parts containing hidden failures by some probability level. However, the commonly used screening methods are not without dangers for the faultless parts and their efficiency is limited. The examination of the noise of the power supply current - as a new method - offers new dimensions to screen out the parts containing hidden failures.

Keywords:

reliability screening, noise of power supply current, CMOS digital ICs, lifetime test

How to Cite

Kincses, Z., Bánlaki , P. “STUDY OF THE RELATION BETWEEN THE RELIABILITY AND THE NOISE OF DIGITAL SILICON INTEGRATED CIRCUITS ”, Periodica Polytechnica Electrical Engineering, 38(2), pp. 109–123, 1994.

Issue

Vol. 38 No. 2 (1994)

Section

Articles