ALGORITHMS OF FUNCTIONAL LEVEL TESTABILITY ANALYSIS FOR DIGITAL CIRCUITS
Abstract
A general approach is proposed for calculating controllabilities and observabilities of signals in sequential and combinational circuits at the functional level. The methods and algorithms are based on alternative graphs which are an extension of binary decision diagrams. The algorithms are general and can be easily adjusted for calculation of different testability measures. .
Keywords:
digital circuits, finite state machines, testability measures. alternative graphs, probabilistic approach.How to Cite
Ubar, R., Kuchinski, K. “ALGORITHMS OF FUNCTIONAL LEVEL TESTABILITY ANALYSIS FOR DIGITAL CIRCUITS”, Periodica Polytechnica Electrical Engineering, 36(3-4), pp. 295–308, 1992.
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