THE USE OF A FUNCTIONAL DESCRIPTION LANGUAGE FOR TEST GENERATION
Abstract
The paper presents a new hardware-description language (OPART) which serves for spec- ifying the functional models of logic elements for an automatic test-generation program. The significance and novelty of OPART rely on the fact that it enables in a user-oriented way to define models not only for fault simulation, but also for algorithmic test calcula- tion. In the paper the basic syntactic features of OPART are first discussed. After that examples and the computer implementation will be overviewed.
Keywords:
test pattern generation, fault simulation, hardware-description languages, logic modellingHow to Cite
Nagy, Z., Sziray, J. “THE USE OF A FUNCTIONAL DESCRIPTION LANGUAGE FOR TEST GENERATION ”, Periodica Polytechnica Electrical Engineering, 35(4), pp. 263–272, 1991.
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