THE USE OF A FUNCTIONAL DESCRIPTION LANGUAGE FOR TEST GENERATION

Authors

  • Zsolt Nagy
  • József Sziray

Abstract

The paper presents a new hardware-description language (OPART) which serves for spec- ifying the functional models of logic elements for an automatic test-generation program. The significance and novelty of OPART rely on the fact that it enables in a user-oriented way to define models not only for fault simulation, but also for algorithmic test calcula- tion. In the paper the basic syntactic features of OPART are first discussed. After that examples and the computer implementation will be overviewed.

Keywords:

test pattern generation, fault simulation, hardware-description languages, logic modelling

How to Cite

Nagy, Z., Sziray, J. “THE USE OF A FUNCTIONAL DESCRIPTION LANGUAGE FOR TEST GENERATION ”, Periodica Polytechnica Electrical Engineering, 35(4), pp. 263–272, 1991.

Issue

Section

Articles