AN APPROACH TO DEVELOP INTELLIGENT DIGITAL TEST SYSTEMS

Abstract

A new test generation method is developed for digital systems on the basis of alternative graphs. Tests are generated using symbolic signal values and are organized in the compact way - in form of symbolic test programs and data arrays. A new architecture is pro- posed for test systems which is suited for on-line generating deterministic test patterns in algorithmic way. Special features are implemented in test generator and tester to support event driven testing, which makes it possible to test dynamically devices that work at higher clock rates than the tester does.