NEW METHODS FOR PSEUDOEXHAUSTIVE TESTING

Abstract

Pseudoexhaustive testing of combinational circuits has become of great importance recently. These methods are keeping most of the benefits of the classical exhaustive testing which check every combination of the input signals, but they need a considerably shorter sequence of test patterns. In this paper we give a survey of pseudoexhaustive testing. Two new code construction methods are presented: a systematic procedure to generate an effective exhaustive code for every two dimensional subspace of the inputs; and an extension of the codes from the k dimensional space to k+1. The efficiency of the new methods is compared to the ones described in the literature.