KINCSES, Zsolt; BÁNLAKI , Pál. STUDY OF THE RELATION BETWEEN THE RELIABILITY AND THE NOISE OF DIGITAL SILICON INTEGRATED CIRCUITS Periodica Polytechnica Electrical Engineering, [S. l.], v. 38, n. 2, p. 109–123, 1994. Disponível em: https://pp.bme.hu/ee/article/view/4456. Acesso em: 28 dec. 2024.