GÄRTNER, Péter. SIDE-EFFECT FAULT MODEL FOR TESTING VLSI CIRCUITS Periodica Polytechnica Electrical Engineering, [S. l.], v. 31, n. 1-2, p. 21–24, 1987. Disponível em: https://pp.bme.hu/ee/article/view/4628. Acesso em: 21 jul. 2025.