HONFI, Dávid; MICSKEI, Zoltán. Supporting Unit Test Generation via Automated Isolation. Periodica Polytechnica Electrical Engineering and Computer Science, [S. l.], v. 61, n. 2, p. 116–131, 2017. 10.3311/PPee.9768. Disponível em: https://pp.bme.hu/eecs/article/view/9768. Acesso em: 28 mar. 2024.