Optoelectronic and Dielectric Properties of Tenorite CuO Thin Films Sprayed at Various Molar Concentrations

Authors

  • Ouarda Ben Messaoud
    Affiliation
    Laboratory of Physics of Thin Films and Applications, Mohamed Khider University, P. O. B. 145 RP, 07000 Biskra, Algeria
  • Abdelouahab Ouahab
    Affiliation
    Laboratory of Physics of Thin Films and Applications, Mohamed Khider University, P. O. B. 145 RP, 07000 Biskra, Algeria
  • Saâd Rahmane
    Affiliation
    Laboratory of Physics of Thin Films and Applications, Mohamed Khider University, P. O. B. 145 RP, 07000 Biskra, Algeria
  • Souheila Hettal
    Affiliation
    Laboratory of Physics of Thin Films and Applications, Mohamed Khider University, P. O. B. 145 RP, 07000 Biskra, Algeria
  • Aicha Kater
    Affiliation
    Laboratory of Physics of Thin Films and Applications, Mohamed Khider University, P. O. B. 145 RP, 07000 Biskra, Algeria
  • Moustefa Sayad
    Affiliation
    Laboratory of Physics of Thin Films and Applications, Mohamed Khider University, P. O. B. 145 RP, 07000 Biskra, Algeria
    Laboratory of New and Renewable Energies in Arid and Saharan Zones, University of Kasdi Merbah Ouargla, P. O. B. 511, 30 000 Ouargla, Algeria
  • Hafida Attouche
    Affiliation
    Laboratory of Physics of Thin Films and Applications, Mohamed Khider University, P. O. B. 145 RP, 07000 Biskra, Algeria
  • Noureddine Gherraf
    Affiliation
    Laboratory of Natural Resources and Management of Sensitive Environments, University Larbi Ben M'hidi Oum El Bouaghi, P. O. B. 358, 04000 Oum El Bouaghi, Algeria
https://doi.org/10.3311/PPch.22136

Abstract

The work in hand presents the elaboration of CuO thin films using a home-made spray pyrolysis technique at room atmosphere. The films were synthesized on preheated glass substrate at 450 °C. The source solution molarity was varied from 0.025 to 0.1 mol/L. The films were characterized by employing X-Ray Diffraction technique, UV-Vis-NIR spectrophotometry, Scanning Electron Microscope imagery, Energy Dispersive Spectroscopy, and four-points probe techniques. The X-ray diffraction analysis confirmed that all films are polycrystalline with a preferred orientation along the plane (−111) of the monoclinic crystal structure phase of tenorite (CuO). The SEM images showed a homogeneous and smooth surface. Crystallinity and grain size were improved. The rise of solution concentration induced a reduction of transmittance and reflectance in the visible region. The energy gap, the absorption coefficient, the extinction coefficient, refractive index, dielectric constant (ԑr and ԑi) and loss energy were estimated from transmittance and reflectance data. The gap energy decreases from 2.72 to 2.56 eV. The film deposited for 0.025 mol/L exhibits the highest real part of the dielectric constant (ԑr ~ 17). The film resistivity which is in order of 102 Ω cm decreases with the increase of molar concentration. The estimated dielectric constant indicated that the resulting CuO thin films could be used as dielectric layers for optoelectronic devices working in Vis-NIR region of radiation. Furthermore, the relatively high band gap, high absorption coefficient and high conductivity of the film obtained at 0.075 mol/L, make them good candidates as absorption layers in solar cells applications.

Keywords:

copper oxide, spray pyrolysis, dielectric constant, molarity, opto-electronic

Citation data from Crossref and Scopus

Published Online

2024-03-06

How to Cite

Ben Messaoud, O., Ouahab, A., Rahmane , S., Hettal, S., Kater, A., Sayad, M. “Optoelectronic and Dielectric Properties of Tenorite CuO Thin Films Sprayed at Various Molar Concentrations”, Periodica Polytechnica Chemical Engineering, 68(1), pp. 93–105, 2024. https://doi.org/10.3311/PPch.22136

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