TESTING OF MICROPROCESSORS

Abstract

With the growing use of the microprocessors the problematics of testing become more and more important for the reliability of the instrumentation. The paper gives a survey of the usual strategies and methods for CPU testing in microprocessor controlled equipment. The effects of the state-of-the-art field service methods on the self-test technology are discussed. Description of a new algorithm based on information compression is given together with some related realization experiences.